A Flexible Programmable Memory BIST for Embedded Single-Port Memory and Dual-Port Memory
نویسندگان
چکیده
منابع مشابه
A Flexible Programmable Memory BIST for Embedded Single-Port Memory
© 2013 ETRI Journal, Volume 35, Number 5, October 2013 Programmable memory built-in self-test (PMBIST) is an attractive approach for testing embedded memory. However, the main difficulties of the previous works are the large area overhead and low flexibility. To overcome these problems, a new flexible PMBIST (FPMBIST) architecture that can test both single-port memory and dual-port memory using...
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ژورنال
عنوان ژورنال: ETRI Journal
سال: 2013
ISSN: 1225-6463
DOI: 10.4218/etrij.13.0112.0717